Atomic Force Microscope (AFM) analysis

An Atomic Force Microscope (AFM) is a high-resolution scanning instrument widely used in nanotechnology, materials science, and biological research to analyze surfaces at the atomic and molecular scales. Unlike traditional optical microscopes, which are limited by the wavelength of light, AFMs can achieve resolutions down to fractions of a nanometer, making them essential tools for studying structures that cannot be observed with conventional methods.

At the core of an AFM is a sharp probe mounted on a flexible cantilever. As the probe scans the sample surface, forces such as van der Waals interactions, electrostatic forces, or repulsive atomic forces cause the cantilever to deflect. These deflections are detected—usually by a laser beam reflected off the cantilever onto a photodetector—and converted into highly detailed topographical images. The instrument can operate in several modes, including contact mode, non-contact mode, and tapping mode, each suited for different types of materials and research requirements.